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PHYWE Characteristic X-rays of Copper

PHYWE Characteristic X-rays of Copper




Learn about:
  • Bremsstrahlung
  • Characteristic radiation
  • Energy levels
  • Crystal structures
  • Lattice constant
  • Absorption
  • Absorption edges
  • Interference
  • The Bragg equation
  • Order of diffraction
Spectra of X-rays from a copper anode are to be analyzed by means of different monocrystals and the results plotted graphically. The energies of the characteristic lines are then to be determined from the positions of the glancing angles for the various orders of diffraction.

In this experiment the intensity of the X-rays emitted by the copper anode at maximum anode voltage and anode current will be recorded as a function of the Bragg angle, using an LiF monocrystal as analyzer. This process is then repeated using the KBr monocrystal as analyzer. Finally, the energy values of the characteristic copper lines can be calculated and compared with the energy differences of the copper energy terms.

When electrons of high energy impinge on the metallic anode of an X-ray tube, X-rays with a continuous energy distribution are produced. X-ray lines whose energies are not dependent on the anode voltage and which are specific to the anode materials, the so-called characteristic X-ray lines, are superimposed on the continuum. They are produced as follows: An impact of an electron on an anode atom in the K shell, for example, can ionize that atom. The resulting vacancy in the shell is then filled by an electron from a higher energy level. The energy released in this de-excitation process can then be transformed into an X-ray which is specific for the anode atom.

Characteristic X-rays produced from either the L -> K or the M -> K transitions are called K and K lines respectively. M1 -> K and L1 -> K transitions do not take place due to quantum mechanical selection rules.

The analysis of polychromatic X-rays is made possible through the use of a monocrystal. When X-rays of wavelength ? impinge on a monocrystal under glancing angle ?, constructive interference after scattering only occurs when the path difference d of the partial waves reflected from the lattice planes is one or more wavelengths.

Includes X-ray basic unit, 35 kV, goniometer for X-ray unit, 35 kV, plug-in module with Cu X-ray tube, counter tube, type B, mounted Lithium fluoride crystal, mounted Potassium bromide crystal, XYt recorder, connecting cables, and manual on CD-ROM.

System requirements:
PC with Windows 95 or higher.

For your convenience this experiment is available to you as a complete set.
Everything you require to perform the activities are included in the total price.
For assistance in using your new equipment we also offer professional development (WLS1808-24) on all PHYWE line products.
For customization options and pricing please contact your local Cenco representative.



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Product Datasheet PHYWE Characteristic X-rays of Copper


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WLS1807-28
Characteristic Xrays of Copper
This Item is currently on backorder and will ship when it becomes available

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$19,199.99





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